The course will introduce modern scanning probe microscopy (SPM) techniques, mainly scanning tunneling microscopy (STM) and atomic force microscopy (AFM). The principle of STM and AFM is discussed first discussed. Fundamental measurement methods and modes of operations in STM and AFM are then introduced. Selected examples in SPM applications in contemporary scientific and industrial research will be given. Advanced SPM techniques will be broadly covered and students are expected to participate in this part of discussion through oral presentation and literature survey. This course contains mandatory hand-on laboratory experiments, which will be AFM or STMs on 2D materials.